IEEE - Institute of Electrical and Electronics Engineers, Inc. - Test and first application of artificial sapphire sensors

2010 IEEE Nuclear Science Symposium and Medical Imaging Conference (2010 NSS/MIC)

Author(s): Ignatenko, A. ; Baboi, N. ; Henschel, H. ; Hensler, O. ; Lange, W. ; Lohmann, W. ; Schmitz, M. ; Schuwalow, S. ; Wittenburg, K.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2010
Conference Location: Knoxville, TN, USA, USA
Conference Date: 30 October 2010
Page(s): 650 - 654
ISBN (CD): 978-1-4244-9104-9
ISBN (Electronic): 978-1-4244-9105-6
ISBN (Paper): 978-1-4244-9106-3
ISSN (CD): 1082-3654
ISSN (Paper): 1095-7863
DOI: 10.1109/NSSMIC.2010.5873839
Regular:

Samples of monocrystalline sapphire sensors of 10×10 mm2 area and 0.5 mm thickness with the initial charge collection efficiency of about 2% have been studied in electron beams. The... View More

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