IEEE - Institute of Electrical and Electronics Engineers, Inc. - SNM detection based on X-ray scattering

2010 IEEE Nuclear Science Symposium and Medical Imaging Conference (2010 NSS/MIC)

Author(s): Weiqi Huang ; Yigang Yang ; Yuanjing Li ; Bairong Wang ; Yongshun Xiao
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2010
Conference Location: Knoxville, TN, USA, USA
Conference Date: 30 October 2010
Page(s): 528 - 530
ISBN (CD): 978-1-4244-9104-9
ISBN (Electronic): 978-1-4244-9105-6
ISBN (Paper): 978-1-4244-9106-3
ISSN (CD): 1082-3654
ISSN (Paper): 1095-7863
DOI: 10.1109/NSSMIC.2010.5873817
Regular:

We present in this paper the study of special nuclear materials (SNM) detection method based on Pair production and Compton scattering Atomic Number Identification (PCANI) technique. PCANI, a... View More

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