IEEE - Institute of Electrical and Electronics Engineers, Inc. - Punch-through effect and collapse of the electric field in silicon strip detectors

2010 IEEE Nuclear Science Symposium and Medical Imaging Conference (2010 NSS/MIC)

Author(s): Betancourt, C. ; Wright, J. ; Bielecki, A. ; Butko, Z. ; Parker, C. ; Ptak, N. ; Fadeyev, V. ; Sadrozinski, H.F.-W.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2010
Conference Location: Knoxville, TN, USA, USA
Conference Date: 30 October 2010
Page(s): 388 - 391
ISBN (CD): 978-1-4244-9104-9
ISBN (Electronic): 978-1-4244-9105-6
ISBN (Paper): 978-1-4244-9106-3
ISSN (CD): 1082-3654
ISSN (Paper): 1095-7863
DOI: 10.1109/NSSMIC.2010.5873786
Regular:

Silicon strip trackers are an essential component of current and future LHC experiments. They present a large instrumented volume and provide a primary means of momentum measurement for charged... View More

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