IEEE - Institute of Electrical and Electronics Engineers, Inc. - FastSim: Fast simulation of the SuperB detector

2010 IEEE Nuclear Science Symposium and Medical Imaging Conference (2010 NSS/MIC)

Author(s): Andreassen, R. ; Arnaud, N. ; Brown, D.N. ; Burmistrov, L. ; Carlson, J. ; Cheng, C.-H. ; Di Simone, A. ; Gaponenko, I. ; Manoni, E. ; Perez, A. ; Rama, M. ; Roberts, D. ; Rotondo, M. ; Simi, G. ; Sokoloff, M. ; Suzuki, A. ; Walsh, J.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2010
Conference Location: Knoxville, TN, USA, USA
Conference Date: 30 October 2010
Page(s): 322 - 326
ISBN (CD): 978-1-4244-9104-9
ISBN (Electronic): 978-1-4244-9105-6
ISBN (Paper): 978-1-4244-9106-3
ISSN (CD): 1082-3654
ISSN (Paper): 1095-7863
DOI: 10.1109/NSSMIC.2010.5873773
Regular:

We have developed a parameterized (fast) simulation for detector optimization and physics reach studies of the proposed SuperB Flavor Factory in Italy. Detector components are modeled as thin... View More

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