IEEE - Institute of Electrical and Electronics Engineers, Inc. - A demonstrator prototype of multi-linear silicon drift detector as scatter detector for Compton imaging

2010 IEEE Nuclear Science Symposium and Medical Imaging Conference (2010 NSS/MIC)

Author(s): Castoldi, A. ; Guazzoni, C. ; Robbiati, M. ; Tassinari, G. ; Hartmann, R. ; Struder, L.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2010
Conference Location: Knoxville, TN, USA, USA
Conference Date: 30 October 2010
Page(s): 52 - 58
ISBN (CD): 978-1-4244-9104-9
ISBN (Electronic): 978-1-4244-9105-6
ISBN (Paper): 978-1-4244-9106-3
ISSN (CD): 1082-3654
ISSN (Paper): 1095-7863
DOI: 10.1109/NSSMIC.2010.5873716
Regular:

Compton imaging is of interest in the fields of astrophysics, homeland security and nuclear medicine as it can provide high spatial resolution and detection efficiency even at high γ-ray... View More

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