IEEE - Institute of Electrical and Electronics Engineers, Inc. - Using Traceability to Enhance Mutation Analysis Dedicated to Model Transformation

2010 Workshop on Model-Driven Engineering, Verification, and Validation (MoDeVVa)

Author(s): Aranega, V. ; Mottu, J. ; Etien, A. ; Dekeyser, J.-L.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2010
Conference Location: Oslo, Norway, Norway
Conference Date: 3 October 2010
Page(s): 1 - 6
ISBN (Electronic): 978-0-7695-4384-0
DOI: 10.1109/MoDeVVa.2010.15
Regular:

Techniques initially used for programs require modifications to be properly used with to model transformation characteristics. Mutation analysis is one of these techniques. IIt aims to qualify a... View More

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