IEEE - Institute of Electrical and Electronics Engineers, Inc. - Defect detection for multithreaded programs with semaphore-based synchronization

2010 6th Central and Eastern European Software Engineering Conference in Russia (CEE-SECR 2010)

Author(s): Moiseev, M.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2010
Conference Location: Moscow, Russia, Russia
Conference Date: 13 October 2010
Page(s): 64 - 70
ISBN (CD): 978-1-4577-0604-2
ISBN (Electronic): 978-1-4577-0606-6
ISBN (Paper): 978-1-4577-0605-9
DOI: 10.1109/CEE-SECR.2010.5783153
Regular:

The solution to the problem of automatic defects detection in multithreaded programs is covered in this paper. General approaches for defect detection are considered. Static analysis is chosen... View More

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