IEEE - Institute of Electrical and Electronics Engineers, Inc. - Efficient DFV-aware flip-flops

APCCAS 2010-2010 IEEE Asia Pacific Conference on Circuits and Systems

Author(s): Changnoh Yoon ; Youngmin Cho ; Jinsang Kim ; Won-Kyung Cho
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 2010
Conference Location: Kuala Lumpur, Malaysia, Malaysia
Conference Date: 6 December 2010
Page(s): 975 - 978
ISBN (CD): 978-1-4244-7455-4
ISBN (Electronic): 978-1-4244-7456-1
ISBN (Paper): 978-1-4244-7454-7
DOI: 10.1109/APCCAS.2010.5774876
Regular:

The advanced nanometer circuits are susceptible to errors caused by process, voltage, and temperature (PVT) variation and single event upset (SEU). The state-of-the-art variation-aware flip-flops... View More

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