IEEE - Institute of Electrical and Electronics Engineers, Inc. - A PCI166-compatible 3×VDD-tolerant mixed-voltage I/O buffer

APCCAS 2010-2010 IEEE Asia Pacific Conference on Circuits and Systems

Author(s): Ron-Chi Kuo ; Hsiao-Han Hou ; Chua-Chin Wang
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 2010
Conference Location: Kuala Lumpur, Malaysia, Malaysia
Conference Date: 6 December 2010
Page(s): 320 - 323
ISBN (CD): 978-1-4244-7455-4
ISBN (Electronic): 978-1-4244-7456-1
ISBN (Paper): 978-1-4244-7454-7
DOI: 10.1109/APCCAS.2010.5774846
Regular:

A PCI166-compatible 3×VDD mixed-voltage I/O buffer with ESD protection consideration is proposed. By using a compact Dynamic gate bias generator to provide appropriate gate drive voltages for the... View More

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