IEEE - Institute of Electrical and Electronics Engineers, Inc. - Comparison between Nonnormal Process Capability Study Based on Two Kinds of Transformations

2010 1st ACIS Intl Symp on Cryptography & Network Security, Data Mining & Knowledge Discovery, E-Commerce & Its Applications and Embedded Sys (CDEE)

Author(s): Jie Rong Yang ; Xiang dong Song ; Zhe Ming
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2010
Conference Location: Qinhuandao, Hebei, China, China
Conference Date: 23 October 2010
Page(s): 201 - 205
ISBN (Paper): 978-1-4244-9595-5
DOI: 10.1109/CDEE.2010.97
Regular:

Standard process capability index is based on the assumption that process output obeys normal distribution. There exist a lot of process outputs which don't obey normal distribution, such as... View More

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