IEEE - Institute of Electrical and Electronics Engineers, Inc. - Multiple electrode probe assemblies and nondestructive testing of high ampacity joints

Author(s): F. Morin ; M. Parker ; G. Rousseau ; M. Saint-Louis
Sponsor(s): IEEE
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 March 1991
Volume: 14
Page Count: 5
Page(s): 26 - 30
ISSN (Paper): 0148-6411
DOI: 10.1109/33.76506
Regular:

Two of the major impediments to accurate measurement of the electrical resistance of high-ampacity joints are the sensitivity necessary for measurements generally in the micro-ohms and the degree... View More

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