IEEE - Institute of Electrical and Electronics Engineers, Inc. - Constraint-based automatic test data generation

Author(s): R.A. DeMilli ; A.J. Offutt
Sponsor(s): IEEE Comput. Soc. Tech. Council on Software Eng.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 1991
Volume: 17
Page Count: 11
Page(s): 900 - 910
ISSN (Paper): 0098-5589
DOI: 10.1109/32.92910
Regular:

A novel technique for automatically generating test data is presented. The technique is based on mutation analysis and creates test data that approximate relative adequacy. It is a fault-based... View More

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