IEEE - Institute of Electrical and Electronics Engineers, Inc. - Research of fault current limiter for 500kV power grid

2010 International Conference on Power System Technology - (POWERCON 2010)

Author(s): Xuefen Jin ; Chaobo Dai ; Ping Ji ; Shouyuan Wu ; Ping Jing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2010
Conference Location: Zhejiang, Zhejiang, China, China
Conference Date: 24 October 2010
Page(s): 1 - 10
ISBN (CD): 978-1-4244-5939-1
ISBN (Electronic): 978-1-4244-5940-7
ISBN (Paper): 978-1-4244-5938-4
DOI: 10.1109/POWERCON.2010.5666745
Regular:

Configuring large power supply in high load density networks and interconnections between power grids will cause enormous short-circuit current. If the short-circuit current rating of equipment in... View More

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