IEEE - Institute of Electrical and Electronics Engineers, Inc. - Studying the Impact of Clones on Software Defects
2010 17th Working Conference on Reverse Engineering (WCRE)
Author(s): | Selim, G.M.K. ; Barbour, L. ; Weiyi Shang ; Adams, B. ; Hassan, A.E. ; Ying Zou |
Publisher: | IEEE - Institute of Electrical and Electronics Engineers, Inc. |
Publication Date: | 1 October 2010 |
Conference Location: | Beverly, MA, USA, USA |
Conference Date: | 13 October 2010 |
Page(s): | 13 - 21 |
ISBN (Paper): | 978-1-4244-8911-4 |
ISSN (Paper): | 1095-1350 |
DOI: | 10.1109/WCRE.2010.11 |
Regular:
There are numerous studies that examine whether or not cloned code is harmful to software systems. Yet, few of them study which characteristics of cloned code in particular lead to software... View More