IEEE - Institute of Electrical and Electronics Engineers, Inc. - Studying the Impact of Clones on Software Defects

2010 17th Working Conference on Reverse Engineering (WCRE)

Author(s): Selim, G.M.K. ; Barbour, L. ; Weiyi Shang ; Adams, B. ; Hassan, A.E. ; Ying Zou
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2010
Conference Location: Beverly, MA, USA, USA
Conference Date: 13 October 2010
Page(s): 13 - 21
ISBN (Paper): 978-1-4244-8911-4
ISSN (Paper): 1095-1350
DOI: 10.1109/WCRE.2010.11
Regular:

There are numerous studies that examine whether or not cloned code is harmful to software systems. Yet, few of them study which characteristics of cloned code in particular lead to software... View More

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