IEEE - Institute of Electrical and Electronics Engineers, Inc. - Processing of bistatic TanDEM-X data

IGARSS 2010 - 2010 IEEE International Geoscience and Remote Sensing Symposium

Author(s): Breit, H. ; Fritz, T. ; Balss, U. ; Niedermeier, A. ; Eineder, M. ; Yague-Martinez, N. ; Rossi, C.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 July 2010
Conference Location: Honolulu, HI, USA, USA
Conference Date: 25 July 2010
Page(s): 2,640 - 2,643
ISBN (Electronic): 978-1-4244-9566-5
ISBN (Paper): 978-1-4244-9565-8
ISBN (Online): 978-1-4244-9564-1
ISSN (Electronic): 2153-7003
ISSN (Paper): 2153-6996
ISSN (Online): 2153-6996
DOI: 10.1109/IGARSS.2010.5653602
Regular:

On June 21st, 2010, the German radar satellite TanDEM-X was launched and successfully placed in an orbit approaching the TerraSAR-X satellite until both systems will fly in close... View More

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