IEEE - Institute of Electrical and Electronics Engineers, Inc. - Extracting spatial information of harvest index for winter wheat based on modis ndvi in north China
IGARSS 2010 - 2010 IEEE International Geoscience and Remote Sensing Symposium
Author(s): | Jianqiang Ren ; Xingren Liu ; Zhongxin Chen ; Huajun Tang |
Publisher: | IEEE - Institute of Electrical and Electronics Engineers, Inc. |
Publication Date: | 1 July 2010 |
Conference Location: | Honolulu, HI, USA, USA |
Conference Date: | 25 July 2010 |
Page(s): | 2,143 - 2,146 |
ISBN (Electronic): | 978-1-4244-9566-5 |
ISBN (Paper): | 978-1-4244-9565-8 |
ISBN (Online): | 978-1-4244-9564-1 |
ISSN (Electronic): | 2153-7003 |
ISSN (Paper): | 2153-6996 |
ISSN (Online): | 2153-6996 |
DOI: | 10.1109/IGARSS.2010.5651877 |
Regular:
In order to acquire the spatial information of winter wheat harvest index (HI), depending on the crop growth profile of time-series MODIS-NDVI to calculate mean slope of NDVI curve and accumulated... View More