IEEE - Institute of Electrical and Electronics Engineers, Inc. - Extracting spatial information of harvest index for winter wheat based on modis ndvi in north China

IGARSS 2010 - 2010 IEEE International Geoscience and Remote Sensing Symposium

Author(s): Jianqiang Ren ; Xingren Liu ; Zhongxin Chen ; Huajun Tang
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 July 2010
Conference Location: Honolulu, HI, USA, USA
Conference Date: 25 July 2010
Page(s): 2,143 - 2,146
ISBN (Electronic): 978-1-4244-9566-5
ISBN (Paper): 978-1-4244-9565-8
ISBN (Online): 978-1-4244-9564-1
ISSN (Electronic): 2153-7003
ISSN (Paper): 2153-6996
ISSN (Online): 2153-6996
DOI: 10.1109/IGARSS.2010.5651877
Regular:

In order to acquire the spatial information of winter wheat harvest index (HI), depending on the crop growth profile of time-series MODIS-NDVI to calculate mean slope of NDVI curve and accumulated... View More

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