IEEE - Institute of Electrical and Electronics Engineers, Inc. - Use of the merged dual-frequency radar altimeter backscatter data over China land surface

IGARSS 2010 - 2010 IEEE International Geoscience and Remote Sensing Symposium

Author(s): Le Yang ; Hejuan Du ; Hongzhang Ma ; Qinhuo Liu
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 July 2010
Conference Location: Honolulu, HI, USA, USA
Conference Date: 25 July 2010
Page(s): 1,454 - 1,457
ISBN (Electronic): 978-1-4244-9566-5
ISBN (Paper): 978-1-4244-9565-8
ISBN (Online): 978-1-4244-9564-1
ISSN (Electronic): 2153-7003
ISSN (Paper): 2153-6996
ISSN (Online): 2153-6996
DOI: 10.1109/IGARSS.2010.5650652
Regular:

It is a special way to investigate continental surfaces using radar altimeter, besides scatterometers and Synthetic Aperture Radar among the active microwave remote sensing sensors for the... View More

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