IEEE - Institute of Electrical and Electronics Engineers, Inc. - GUI regression testing based on function-diagram

2010 IEEE International Conference on Intelligent Computing and Intelligent Systems (ICIS 2010)

Author(s): ZhanWei Hui ; Ran Chen ; Song Huang ; Bin Hu
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2010
Conference Location: Xiamen, China, China
Conference Date: 29 October 2010
Volume: 2
Page(s): 559 - 563
ISBN (CD): 978-1-4244-6584-2
ISBN (Electronic): 978-1-4244-6585-9
ISBN (Paper): 978-1-4244-6582-8
DOI: 10.1109/ICICISYS.2010.5658394
Regular:

Regression testing which is part of the software life cycle costs much time in the whole process of testing, especially in GUI (Graphical User Interface) testing. Thus aiming at the... View More

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