IEEE - Institute of Electrical and Electronics Engineers, Inc. - Maximum likelihood estimation of Weibull parameters for two independent competing risk

Author(s): T. Ishioka ; Y. Nonaka
Sponsor(s): IEEE Reliability Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 1991
Volume: 40
Page Count: 4
Page(s): 71 - 74
ISSN (Paper): 0018-9529
ISSN (Online): 1558-1721
DOI: 10.1109/24.75338
Regular:

A stable technique for obtaining the maximum-likelihood estimate of Weibull parameters of the life distributions of two components that form a series system is presented. The technique requires... View More

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