IEEE - Institute of Electrical and Electronics Engineers, Inc. - Is Data Privacy Always Good for Software Testing?

2010 IEEE 21st International Symposium on Software Reliability Engineering (ISSRE)

Author(s): Grechanik, M. ; Csallner, C. ; Chen Fu ; Qing Xie
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 2010
Conference Location: San Jose, CA, USA, USA
Conference Date: 1 November 2010
Page(s): 368 - 377
ISBN (CD): 978-0-7695-4255-3
ISBN (Paper): 978-1-4244-9056-1
ISSN (CD): 1071-9458
ISSN (Paper): 1071-9458
DOI: 10.1109/ISSRE.2010.13
Regular:

Database-centric applications (DCAs) are common in enterprise computing, and they use nontrivial databases. Testing of DCAs is increasingly outsourced to test centers in order to achieve lower... View More

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