IEEE - Institute of Electrical and Electronics Engineers, Inc. - Effects of failure criteria on the constant humidity test results

2010 3rd Electronic System-Integration Technology Conference (ESTC)

Author(s): Kokko, K. ; Frisk, L.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2010
Conference Location: Berlin, Germany, Germany
Conference Date: 13 September 2010
Page(s): 1 - 4
ISBN (Electronic): 978-1-4244-8555-0
ISBN (Paper): 978-1-4244-8553-6
ISBN (Online): 978-1-4244-8554-3
DOI: 10.1109/ESTC.2010.5642959
Regular:

Accelerated life-testing is much used in the reliability study of electronics. Failure criteria need to be assessed due to the application. For some applications even small changes in a variable... View More

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