IEEE - Institute of Electrical and Electronics Engineers, Inc. - Study on evolution mechanism of fateful stampede accident based on graphical evaluation and review technique

2010 IEEE International Conference on Systems, Man and Cybernetics - SMC

Author(s): Mingli Hu ; Zhigeng Fang ; Sifeng Liu ; Wei Chen ; Baohua Yang
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2010
Conference Location: Istanbul, Turkey, Turkey
Conference Date: 10 October 2010
Page(s): 2,976 - 2,978
ISBN (CD): 978-1-4244-6587-3
ISBN (Electronic): 978-1-4244-6588-0
ISBN (Paper): 978-1-4244-6586-6
ISSN (CD): 1062-922X
ISSN (Paper): 1062-922X
DOI: 10.1109/ICSMC.2010.5641989
Regular:

Fateful stampede accident has become one of hot spots in public security field because of its sudden and serious consequence. Actual cases show that crowding is not a sufficient condition for... View More

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