IEEE - Institute of Electrical and Electronics Engineers, Inc. - The Effect of Pb-Cu Interaction on Ultrastructure of Wheat

2010 International Conference on Multimedia Technology (ICMT)

Author(s): Xiao Xin ; Feng Qiyan ; Ding Yi ; Zhang Shuang
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2010
Conference Location: Ningbo, China, China
Conference Date: 29 October 2010
Page(s): 1 - 3
ISBN (CD): 978-1-4244-7873-6
ISBN (Electronic): 978-1-4244-7874-3
ISBN (Paper): 978-1-4244-7871-2
DOI: 10.1109/ICMULT.2010.5631354
Regular:

Heavy metals are important factors influencing plants' growth and physiology, sustainable agriculture and ecological environment. Heavy metal research is thus an important topic in environmental... View More

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