IEEE - Institute of Electrical and Electronics Engineers, Inc. - A New Founded Error Contamination Mechanism in Numerical Weather Forecasting Models

2010 International Conference on Multimedia Technology (ICMT)

Author(s): Tan Jiqing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2010
Conference Location: Ningbo, China, China
Conference Date: 29 October 2010
Page(s): 1 - 4
ISBN (CD): 978-1-4244-7873-6
ISBN (Electronic): 978-1-4244-7874-3
ISBN (Paper): 978-1-4244-7871-2
DOI: 10.1109/ICMULT.2010.5631296
Regular:

Traditionally speaking, the error growth rate is considered unpredictable because of the uncertainty of unavoidable errors in data collection. A new kind of errors can be detected in the forecast... View More

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