IEEE - Institute of Electrical and Electronics Engineers, Inc. - Linear Edges Detections Based on Ridgelet Analysis

2010 International Conference on Multimedia Technology (ICMT)

Author(s): Yunxiao Bai ; Shiru Qu
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2010
Conference Location: Ningbo, China, China
Conference Date: 29 October 2010
Page(s): 1 - 4
ISBN (CD): 978-1-4244-7873-6
ISBN (Electronic): 978-1-4244-7874-3
ISBN (Paper): 978-1-4244-7871-2
DOI: 10.1109/ICMULT.2010.5629867
Regular:

Abstract-Feature detection is an important point in picture process. The results of its detection will affect pattern recognition and classification directly. Based on Radon transform and wavelet... View More

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