IEEE - Institute of Electrical and Electronics Engineers, Inc. - Study on the Method of Automatic Inspection the Large Spinneret

2010 International Conference on Electrical and Control Engineering (ICECE 2010)

Author(s): Chongchang Yang ; Chunlei Li ; Bin Cui
Sponsor(s): IEEE
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2010
Conference Location: Wuhan, China
Conference Date: 25 June 2010
Page(s): 2,162 - 2,165
ISBN (CD): 978-0-7695-4031-3
ISBN (Electronic): 978-1-4244-6881-2
ISBN (Paper): 978-1-4244-6880-5
DOI: 10.1109/iCECE.2010.532
Regular:

The large spinneret will be deformed after repeated using and the surface of it will become unsmooth, so the CCD can not acquire clear capillary image, then the automatic inspection system makes... View More

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