IEEE - Institute of Electrical and Electronics Engineers, Inc. - Hardware Circuit Design on Torsional Spring Testing

2010 International Conference on Electrical and Control Engineering (ICECE)

Author(s): Jianjun Ding ; Chao Sun
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2010
Conference Location: Wuhan, China, China
Conference Date: 25 June 2010
Page(s): 3,788 - 3,790
ISBN (CD): 978-0-7695-4031-3
ISBN (Electronic): 978-1-4244-6881-2
ISBN (Paper): 978-1-4244-6880-5
DOI: 10.1109/iCECE.2010.924
Regular:

A new type of torsional spring testing system's hardware circuit is introduced briefly in this article. There are two main parameters should be tested: the angle and torque which are acquired from... View More

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