IEEE - Institute of Electrical and Electronics Engineers, Inc. - Analysis of Time Evolution of Patterns Based on Various Image Processing Techinques

2010 International Conference on Electrical and Control Engineering (ICECE)

Author(s): Junying Chen ; Lifang Dong ; Han Yue ; Hong Xiao ; Yuanyuan Li
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2010
Conference Location: Wuhan, China, China
Conference Date: 25 June 2010
Page(s): 441 - 444
ISBN (CD): 978-0-7695-4031-3
ISBN (Electronic): 978-1-4244-6881-2
ISBN (Paper): 978-1-4244-6880-5
DOI: 10.1109/iCECE.2010.114
Regular:

Images of patterns are processed with some image processing technology, such as spatial intensity distribution, spatial correlation function and Fourier transformation, thus some important... View More

Advertisement