IEEE - Institute of Electrical and Electronics Engineers, Inc. - Study on Test Case Automated Generation Technology Based on Genetic Algorithm and Ant Colony Optimization Algorithm

2010 International Conference on Electrical and Control Engineering (ICECE)

Author(s): Xu Duo-yong ; Li Zhi-shu
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2010
Conference Location: Wuhan, China, China
Conference Date: 25 June 2010
Page(s): 5,655 - 5,658
ISBN (CD): 978-0-7695-4031-3
ISBN (Electronic): 978-1-4244-6881-2
ISBN (Paper): 978-1-4244-6880-5
DOI: 10.1109/iCECE.2010.1374
Regular:

The enhancement of software quality and reliability has become an important task in the field of software engineering. Software testing is an important step that guarantees software quality and... View More

Advertisement