IEEE - Institute of Electrical and Electronics Engineers, Inc. - A New Advanced Manufacturing Technology - An Optimization Assembly Method Based on RFID

2010 International Conference on Electrical and Control Engineering (ICECE 2010)

Author(s): Li Zhekun ; Wang Feng ; Gao Lei ; Li Min
Sponsor(s): IEEE
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2010
Conference Location: Wuhan, China
Conference Date: 25 June 2010
Page(s): 117 - 120
ISBN (CD): 978-0-7695-4031-3
ISBN (Electronic): 978-1-4244-6881-2
ISBN (Paper): 978-1-4244-6880-5
DOI: 10.1109/iCECE.2010.37
Regular:

This paper analyzes the problems in traditional manufacturing and assembly, puts forward the Estimation Indication for Cost of Quality Losing in an optimization assembly which will be based on... View More

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