IEEE - Institute of Electrical and Electronics Engineers, Inc. - Semi-Automatic System for Testing Dielectric Properties of Low-Voltage Busbar

2010 International Conference on Electrical and Control Engineering (ICECE 2010)

Author(s): Yang Xuemei ; She Jiangfeng
Sponsor(s): IEEE
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2010
Conference Location: Wuhan, China
Conference Date: 25 June 2010
Page(s): 1,876 - 1,879
ISBN (CD): 978-0-7695-4031-3
ISBN (Electronic): 978-1-4244-6881-2
ISBN (Paper): 978-1-4244-6880-5
DOI: 10.1109/iCECE.2010.461
Regular:

One semi-automatic system is developed for testing the dielectric properties and grounding resistance of low-voltage busbar, one type of large-capacity electric power transmission equipment. The... View More

Advertisement