IEEE - Institute of Electrical and Electronics Engineers, Inc. - Mix-mode Crack Growth Intelligence Analysis and Simulation Module Development Based on UIDL and APDL

2010 International Conference on Electrical and Control Engineering (ICECE)

Author(s): Yuantao Sun ; Qin Zhang
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2010
Conference Location: Wuhan, China, China
Conference Date: 25 June 2010
Page(s): 1,276 - 1,279
ISBN (CD): 978-0-7695-4031-3
ISBN (Electronic): 978-1-4244-6881-2
ISBN (Paper): 978-1-4244-6880-5
DOI: 10.1109/iCECE.2010.317
Regular:

As a main defect, the crack has enormous threat on structure safety, which the great majority is mix-mode in engineering. At present, mix-mode crack analysis mainly depend on the manpower way to... View More

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