IEEE - Institute of Electrical and Electronics Engineers, Inc. - A New Method of Early Real-Time Fault Diagnosis for Technical Process

2010 International Conference on Electrical and Control Engineering (ICECE)

Author(s): Lihua Sun ; Yingjun Guo ; Haichao Ran
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2010
Conference Location: Wuhan, China, China
Conference Date: 25 June 2010
Page(s): 4,912 - 4,915
ISBN (CD): 978-0-7695-4031-3
ISBN (Electronic): 978-1-4244-6881-2
ISBN (Paper): 978-1-4244-6880-5
DOI: 10.1109/iCECE.2010.1188
Regular:

By taking the process of synthetic ammonia decarbornization as the research object, a new method of early real-time fault diagnosis based on the linear classifier-reforming neural network... View More

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