IEEE - Institute of Electrical and Electronics Engineers, Inc. - Based on CCD Imaging Ball Outside the New Algorithm for Extracting Profile

2010 International Conference on Electrical and Control Engineering (ICECE)

Author(s): Zhang Chijun ; Liu Wangsheng ; Xie Jinsong
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2010
Conference Location: Wuhan, China, China
Conference Date: 25 June 2010
Page(s): 529 - 531
ISBN (CD): 978-0-7695-4031-3
ISBN (Electronic): 978-1-4244-6881-2
ISBN (Paper): 978-1-4244-6880-5
DOI: 10.1109/iCECE.2010.136
Regular:

An automatic surface defect of Steel Ball detection system based on the CCD image processing technology has been designed. The system consists of automatic feeding stuff mechanism, feeding stuff... View More

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