IEEE - Institute of Electrical and Electronics Engineers, Inc. - Bayes Reliability Assessment for Micro-accelerometer Based on Failure Statistical Model

2010 International Conference on Electrical and Control Engineering (ICECE)

Author(s): Zhou Peng-bin ; Ma Xi-hong
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2010
Conference Location: Wuhan, China, China
Conference Date: 25 June 2010
Page(s): 536 - 539
ISBN (CD): 978-0-7695-4031-3
ISBN (Electronic): 978-1-4244-6881-2
ISBN (Paper): 978-1-4244-6880-5
DOI: 10.1109/iCECE.2010.138
Regular:

Foundation on the characteristics of long life and high reliability products, on the condition of const failure mechanism. Reliability Assessment based on failure statistical model is proposed.... View More

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