IEEE - Institute of Electrical and Electronics Engineers, Inc. - A Research on BIT Single-Fault Threshold Value Setting Approach Based on ROC

2010 International Conference on Communications and Intelligence Information Security (ICCIIS)

Author(s): Xiaojie Zhang ; Daozhen Wang ; Tongmin Jiang ; Dong Wang ; Xiaofeng Wang
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2010
Conference Location: Xi'an, WShanxi, China, China
Conference Date: 13 October 2010
Page(s): 36 - 39
ISBN (CD): 978-0-7695-4260-7
ISBN (Paper): 978-1-4244-8649-6
DOI: 10.1109/ICCIIS.2010.19
Regular:

In order to solve the problem that setting the double threshold value hypothesis question under the single breakdown in the BIT, to decrease BIT's false alarm rate, and improve BIT's testability.... View More

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