IEEE - Institute of Electrical and Electronics Engineers, Inc. - Analysis on the Key Successful Factors of Enterprise-Wide Risk Management: Based on the Insight of Effective Encouragement

2010 Fourth International Conference on Mangement of E-Commerce and E-Government (ICMeCG)

Author(s): Yue-hu Lin ; Li-hong Du
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2010
Conference Location: Chengdu, Sichuan, China, China
Conference Date: 23 October 2010
Page(s): 293 - 297
ISBN (Paper): 978-1-4244-8507-9
DOI: 10.1109/ICMeCG.2010.68
Regular:

This paper has emphasized on the internal factors resulting in the inactive involvement of "people" into the effective enterprise-wide risk management (ERM), and further confirms that the... View More

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