IEEE - Institute of Electrical and Electronics Engineers, Inc. - Real-time nondestructive inspection of chestnuts using X-ray imaging and dynamic threshold

2010 World Automation Congress (WAC)

Author(s): Qiang Lu ; Jianrong Cai ; Yongping Li ; Feng Wang
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2010
Conference Location: Kobe, Japan, Japan
Conference Date: 19 September 2010
Page(s): 365 - 368
ISBN (Electronic): 978-1-889335-42-1
ISBN (Paper): 978-1-4244-9673-0
ISSN (CD): 2154-4824
ISSN (Paper): 2154-4824
Regular:

Quality defects in chestnuts seriously affect their market value. The defects in nuts covered with hard reddish-brown shell are very difficult to inspect using conventional nondestructive... View More

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