IEEE - Institute of Electrical and Electronics Engineers, Inc. - Modern information technology applied in evaluation and prediction of wheat quality

2010 World Automation Congress (WAC)

Author(s): Yali Ji ; Xinming Ma ; Lei Xi ; Yinchao Che ; Rui Gao
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2010
Conference Location: Kobe, Japan, Japan
Conference Date: 19 September 2010
Page(s): 293 - 297
ISBN (Electronic): 978-1-889335-42-1
ISBN (Paper): 978-1-4244-9673-0
ISSN (CD): 2154-4824
ISSN (Paper): 2154-4824
Regular:

Based on the research of wheat quality and the application of the safe wheat storage monitoring and prediction system, intelligent evaluation and prediction of wheat quality was achieved with... View More

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