IEEE - Institute of Electrical and Electronics Engineers, Inc. - One extraction method of morph character parameters based on contour tracking

2010 World Automation Congress (WAC)

Author(s): Ding Youchun ; Chen Hong
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2010
Conference Location: Kobe, Japan, Japan
Conference Date: 19 September 2010
Page(s): 329 - 332
ISBN (Electronic): 978-1-889335-42-1
ISBN (Paper): 978-1-4244-9673-0
ISSN (CD): 2154-4824
ISSN (Paper): 2154-4824
Regular:

Aiming at dealing with the complexity of connected component labeling conflict, one labeling method based on contour tracking is put forward. Using different markers for different objects and... View More

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