IEEE - Institute of Electrical and Electronics Engineers, Inc. - Measurement of in-shoe plantar triaxial stresses in high-heeled shoes

2010 3rd International Conference on Biomedical Engineering and Informatics (BMEI)

Author(s): Yan Cong ; Ming Zhang
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2010
Conference Location: Yantai, China, China
Conference Date: 16 October 2010
Volume: 4
Page(s): 1,760 - 1,763
ISBN (CD): 978-1-4244-6497-5
ISBN (Electronic): 978-1-4244-6498-2
ISBN (Paper): 978-1-4244-6495-1
DOI: 10.1109/BMEI.2010.5639873
Regular:

Foot problems such as pain and calluses are common for high-heeled shoe wearers. These problems may be related to the excessive local plantar loading, including pressure and shear stress. The... View More

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