IEEE - Institute of Electrical and Electronics Engineers, Inc. - A computer-aided analyzing system for fetal monitoring parameters

2010 3rd International Conference on Biomedical Engineering and Informatics (BMEI)

Author(s): Yaosheng Lu ; Lelian Bao ; Cen Lu ; Jiashuo Liang
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2010
Conference Location: Yantai, China, China
Conference Date: 16 October 2010
Volume: 2
Page(s): 684 - 688
ISBN (CD): 978-1-4244-6497-5
ISBN (Electronic): 978-1-4244-6498-2
ISBN (Paper): 978-1-4244-6495-1
DOI: 10.1109/BMEI.2010.5640061
Regular:

Electronic fetal monitoring (EFM) is an effective approach to evaluate the status of fetal intrauterine growth and safety. In clinic, fetal monitoring parameters and curves are usually judged... View More

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