IEEE - Institute of Electrical and Electronics Engineers, Inc. - Radiographic analysis of peri-implant trabecular bones after implant placement

2010 3rd International Conference on Biomedical Engineering and Informatics (BMEI)

Author(s): Minjin Kim ; Hyekyung Jeong ; Wonjun Kim ; Han Kyul Kim ; Desok Kim ; Byung-Do Lee
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2010
Conference Location: Yantai, China, China
Conference Date: 16 October 2010
Volume: 2
Page(s): 480 - 484
ISBN (CD): 978-1-4244-6497-5
ISBN (Electronic): 978-1-4244-6498-2
ISBN (Paper): 978-1-4244-6495-1
DOI: 10.1109/BMEI.2010.5639264
Regular:

Intraoral radiographs are routinely used to assess a bone-implant interface after placement of a dental implant. Unlike marginal bone loss occurring in outer and denser crestal bones, bone... View More

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