IEEE - Institute of Electrical and Electronics Engineers, Inc. - Heuristic Bayesian pixel classification for power line inspection

2010 3rd International Congress on Image and Signal Processing (CISP)

Author(s): Shengzhi Du ; van Wyk, B.J. ; Chunling Tu
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2010
Conference Location: Yantai, China, China
Conference Date: 16 October 2010
Volume: 2
Page(s): 960 - 963
ISBN (CD): 978-1-4244-6515-6
ISBN (Electronic): 978-1-4244-6516-3
ISBN (Paper): 978-1-4244-6513-2
DOI: 10.1109/CISP.2010.5646922
Regular:

In this paper the heuristic knowledge obtained using the Hough Transform is applied to determine the prior and posterior probabilities for a traditional Bayesian classifier. This novel Bayesian... View More

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