IEEE - Institute of Electrical and Electronics Engineers, Inc. - Facial feature point extraction using a new improved Active Shape Model

2010 3rd International Congress on Image and Signal Processing (CISP)

Author(s): Li Dang ; Fanrang Kong
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2010
Conference Location: Yantai, China, China
Conference Date: 16 October 2010
Volume: 2
Page(s): 944 - 948
ISBN (CD): 978-1-4244-6515-6
ISBN (Electronic): 978-1-4244-6516-3
ISBN (Paper): 978-1-4244-6513-2
DOI: 10.1109/CISP.2010.5646914
Regular:

In this paper, we present a new improved Active Shape Model (ASM) for facial feature points extraction. ASM performance is often influenced by some factors such as initial position, illumination,... View More

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