IEEE - Institute of Electrical and Electronics Engineers, Inc. - Research on the image definition criterion on the high accuracy image measurement system

2010 3rd International Congress on Image and Signal Processing (CISP)

Author(s): Chun Yang ; Zhong Wang ; Zhenxing Cai ; Jin Zhang
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2010
Conference Location: Yantai, China, China
Conference Date: 16 October 2010
Volume: 4
Page(s): 1,671 - 1,675
ISBN (CD): 978-1-4244-6515-6
ISBN (Electronic): 978-1-4244-6516-3
ISBN (Paper): 978-1-4244-6513-2
DOI: 10.1109/CISP.2010.5647754
Regular:

In the high accuracy measurement system based on image, it is very important for the object plane to realize high accuracy complete focusing. In order to increase the focusing precision, this... View More

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