IEEE - Institute of Electrical and Electronics Engineers, Inc. - On a Double Hump Phenomenon of Current through a Bridge across Parallel Lines

Author(s): E. Takagishi
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 March 1930
Volume: 18
Page(s): 513 - 532
ISSN (Paper): 0731-5996
DOI: 10.1109/JRPROC.1930.222027
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