IEEE - Institute of Electrical and Electronics Engineers, Inc. - A novel all-at-once learning method for multi-class Support Vector Machine

2010 3rd International Congress on Image and Signal Processing (CISP)

Author(s): Shaomin Mu ; Chuanhuan Yin ; ShengFen Tian
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2010
Conference Location: Yantai, China, China
Conference Date: 16 October 2010
Volume: 4
Page(s): 1,543 - 1,546
ISBN (CD): 978-1-4244-6515-6
ISBN (Electronic): 978-1-4244-6516-3
ISBN (Paper): 978-1-4244-6513-2
DOI: 10.1109/CISP.2010.5647176
Regular:

In this paper, first we deal with multi-class problems with Support Vector Machine, and then propose a novel and efficient all-at-once method with Support Vector Machine for solving multi-class... View More

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