IEEE - Institute of Electrical and Electronics Engineers, Inc. - Total variation models based algorithm of illumination normalization for face recognition

2010 3rd International Congress on Image and Signal Processing (CISP)

Author(s): Kai Yan ; Huorong Ren ; Hailong Yu
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2010
Conference Location: Yantai, China, China
Conference Date: 16 October 2010
Volume: 4
Page(s): 1,975 - 1,978
ISBN (CD): 978-1-4244-6515-6
ISBN (Electronic): 978-1-4244-6516-3
ISBN (Paper): 978-1-4244-6513-2
DOI: 10.1109/CISP.2010.5647075
Regular:

This paper proposes a new method for the face illumination normalization, combining Total variation models with Contourlet transform. We iterate the high-frequency information decomposed by the... View More

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