IEEE - Institute of Electrical and Electronics Engineers, Inc. - A fast quality assessment of image blur based on sharpness

2010 3rd International Congress on Image and Signal Processing (CISP)

Author(s): Wang Zhengzi ; Xie Zhihua ; He Cuiqun
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2010
Conference Location: Yantai, China, China
Conference Date: 16 October 2010
Volume: 5
Page(s): 2,302 - 2,306
ISBN (CD): 978-1-4244-6515-6
ISBN (Electronic): 978-1-4244-6516-3
ISBN (Paper): 978-1-4244-6513-2
DOI: 10.1109/CISP.2010.5647837
Regular:

A new metric for image quality assessment in terms of image sharpness is proposed in this paper. To improve the method efficiency, a criterion for edge sharpness is employed and only the sharpest... View More

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